Title :
Effective algorithm for integrating clock gating and power gating to reduce dynamic and active leakage power simultaneously
Author :
Li, Li ; Choi, Ken ; Nan, Haiqing
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
Clock gating and power gating are the two most widely used techniques to reduce dynamic power and leakage power respectively. It is desired that these two techniques can be integrated. In this paper, activity-driven optimized bus specific clock gating (OBSC) is applied to reduce dynamic power, and the enable signal generated by OBSC is used as the sleep signal for power gating. The power gated cells are determined by a proposed forward traversing algorithm. Moreover, minimum idle time concept is used to determine if the insertion of power gating will gain energy reduction. In order to evaluate our technique, ISCAS´89 circuits have been experimented. The simulation results prove that 25.07% dynamic power can be reduced by OBSC, and 45.12% active leakage power can be saved by power gating.
Keywords :
CMOS digital integrated circuits; clocks; electrical faults; integrated circuit design; active leakage power reduction; activity driven optimized bus specific clock gating; dynamic leakage power reduction; forward traversing algorithm; minimum idle time concept; power gating; sleep signal; CMOS integrated circuits; Clocks; Estimation; Heuristic algorithms; Logic gates; Power demand; Registers; Clock gating; forward traversing; low power; power gating;
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-61284-913-3
DOI :
10.1109/ISQED.2011.5770706