• DocumentCode
    3177442
  • Title

    Transient and fine-grained voltage adaptation for variation resilience in VLSI interconnects

  • Author

    Shim, Kyu-Nam ; Hu, Jiang

  • Author_Institution
    Dept. of ECE, Texas A&M Univ., College Station, TX, USA
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Process variations and circuit aging continue to be a main challenge to the power-efficiency of VLSI circuits, as considerable power budget must be allocated to cushion timing variations. A design-time allocation implies a uniform power spending on all fabricated instances, even if many instances do not have strong variations. Adaptive design provides a power-efficient approach to variation tolerance, since it spends power only when the variations of a circuit instance are harmful. This work is an effort on supply voltage adaptation for variation resilience in VLSI interconnects. The main idea is boostable repeater design that can transiently and autonomously raise its Vdd to boost switching speed. The boosting can be turned on/off to compensate variations. Boostable repeater achieves finegrained voltage adaptation without stand-alone voltage regulators or additional power grid. Since interconnect is a widely recognized bottleneck to chip performance and tremendous repeaters are employed on chip designs, boostable repeater has plenty of chances to improve system robustness. Experimental results indicate that our approach significantly outperforms existing techniques including over-design, adaptive supply voltage and online adjustable buffer.
  • Keywords
    VLSI; integrated circuit interconnections; VLSI interconnects; adaptive supply voltage; boostable repeater design; circuit aging; design-time allocation; fine-grained voltage adaptation; online adjustable buffer; power budget; power-efficient approach; process variations; timing variations; transient voltage adaptation; variation resilience; Aging; Boosting; Delay; Regulators; Repeaters; Transistors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770707
  • Filename
    5770707