DocumentCode :
3177442
Title :
Transient and fine-grained voltage adaptation for variation resilience in VLSI interconnects
Author :
Shim, Kyu-Nam ; Hu, Jiang
Author_Institution :
Dept. of ECE, Texas A&M Univ., College Station, TX, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
7
Abstract :
Process variations and circuit aging continue to be a main challenge to the power-efficiency of VLSI circuits, as considerable power budget must be allocated to cushion timing variations. A design-time allocation implies a uniform power spending on all fabricated instances, even if many instances do not have strong variations. Adaptive design provides a power-efficient approach to variation tolerance, since it spends power only when the variations of a circuit instance are harmful. This work is an effort on supply voltage adaptation for variation resilience in VLSI interconnects. The main idea is boostable repeater design that can transiently and autonomously raise its Vdd to boost switching speed. The boosting can be turned on/off to compensate variations. Boostable repeater achieves finegrained voltage adaptation without stand-alone voltage regulators or additional power grid. Since interconnect is a widely recognized bottleneck to chip performance and tremendous repeaters are employed on chip designs, boostable repeater has plenty of chances to improve system robustness. Experimental results indicate that our approach significantly outperforms existing techniques including over-design, adaptive supply voltage and online adjustable buffer.
Keywords :
VLSI; integrated circuit interconnections; VLSI interconnects; adaptive supply voltage; boostable repeater design; circuit aging; design-time allocation; fine-grained voltage adaptation; online adjustable buffer; power budget; power-efficient approach; process variations; timing variations; transient voltage adaptation; variation resilience; Aging; Boosting; Delay; Regulators; Repeaters; Transistors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770707
Filename :
5770707
Link To Document :
بازگشت