DocumentCode :
3177542
Title :
DFM: Impact analysis in a high performance design
Author :
Stalin, S.M. ; Brahme, Amit ; Ramakrishnan, Venkatraman ; Mandal, Ajoy
Author_Institution :
Texas Instrum. (India) Pvt. Ltd., TX, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Layout context effects play a significant role in determining circuit performance in advanced technology nodes. In this paper, a study of the common design practices to tackle the increasing process variations in advanced CMOS technologies is also done. We highlight a method by which we have tackled the challenge of modeling these effects in the critical paths of a large System-on-Chip (SoC) design. We describe an approach to handle these variations when analyzing clock trees and data paths for design timing. The methodology models the true cell context in design layout to comprehend the impact of context specific process variations.
Keywords :
CMOS digital integrated circuits; integrated circuit layout; system-on-chip; CMOS technologies; DFM; SoC design; advanced technology nodes; clock trees; context specific process variations; data paths; design layout; design timing; layout context effects; system-on-chip design; Clocks; Context; Degradation; Layout; Libraries; SPICE; Timing; STA correlation; context aware analysis; critical path analysis; layout proximity effects; process variation analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770712
Filename :
5770712
Link To Document :
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