• DocumentCode
    3177542
  • Title

    DFM: Impact analysis in a high performance design

  • Author

    Stalin, S.M. ; Brahme, Amit ; Ramakrishnan, Venkatraman ; Mandal, Ajoy

  • Author_Institution
    Texas Instrum. (India) Pvt. Ltd., TX, USA
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Layout context effects play a significant role in determining circuit performance in advanced technology nodes. In this paper, a study of the common design practices to tackle the increasing process variations in advanced CMOS technologies is also done. We highlight a method by which we have tackled the challenge of modeling these effects in the critical paths of a large System-on-Chip (SoC) design. We describe an approach to handle these variations when analyzing clock trees and data paths for design timing. The methodology models the true cell context in design layout to comprehend the impact of context specific process variations.
  • Keywords
    CMOS digital integrated circuits; integrated circuit layout; system-on-chip; CMOS technologies; DFM; SoC design; advanced technology nodes; clock trees; context specific process variations; data paths; design layout; design timing; layout context effects; system-on-chip design; Clocks; Context; Degradation; Layout; Libraries; SPICE; Timing; STA correlation; context aware analysis; critical path analysis; layout proximity effects; process variation analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770712
  • Filename
    5770712