DocumentCode
3177626
Title
Selective Metallization for a W-band Meander Line TWT
Author
Sengele, Sean ; Hongrui Jiang ; Booske, John H. ; van der Weide, Daniel ; Bettermann, A.
Author_Institution
Univ. of Wisconsin, Madison
fYear
2007
fDate
15-17 May 2007
Firstpage
1
Lastpage
2
Abstract
The development of terahertz (THz) millimetre-wave (MMW) regime vacuum electronics necessitates the concurrent development of adequate fabrication techniques. Since the size of vacuum electronic devices is proportional to their frequency of operation, fabricating them for the THz and mmw regimes requires fabrication techniques capable of producing millimeter and micron-scale features. Monolithic microfabrication technologies such as deep reactive ion etching (DRIE) have been used widely in the MEMS community for years to achieve these sorts of feature sizes.
Keywords
metallisation; micromechanical devices; travelling wave tubes; MEMS; W-band meander line TWT; fabrication technique; selective metallization process; vacuum electronics; Circuits; Drives; Electromagnetic coupling; Fabrication; Flanges; Metallization; Micromechanical devices; Silicon; Testing; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2007. IVEC '07. IEEE International
Conference_Location
Kitakyushu
Print_ISBN
1-4244-0633-1
Type
conf
DOI
10.1109/IVELEC.2007.4283214
Filename
4283214
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