• DocumentCode
    3177626
  • Title

    Selective Metallization for a W-band Meander Line TWT

  • Author

    Sengele, Sean ; Hongrui Jiang ; Booske, John H. ; van der Weide, Daniel ; Bettermann, A.

  • Author_Institution
    Univ. of Wisconsin, Madison
  • fYear
    2007
  • fDate
    15-17 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The development of terahertz (THz) millimetre-wave (MMW) regime vacuum electronics necessitates the concurrent development of adequate fabrication techniques. Since the size of vacuum electronic devices is proportional to their frequency of operation, fabricating them for the THz and mmw regimes requires fabrication techniques capable of producing millimeter and micron-scale features. Monolithic microfabrication technologies such as deep reactive ion etching (DRIE) have been used widely in the MEMS community for years to achieve these sorts of feature sizes.
  • Keywords
    metallisation; micromechanical devices; travelling wave tubes; MEMS; W-band meander line TWT; fabrication technique; selective metallization process; vacuum electronics; Circuits; Drives; Electromagnetic coupling; Fabrication; Flanges; Metallization; Micromechanical devices; Silicon; Testing; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2007. IVEC '07. IEEE International
  • Conference_Location
    Kitakyushu
  • Print_ISBN
    1-4244-0633-1
  • Type

    conf

  • DOI
    10.1109/IVELEC.2007.4283214
  • Filename
    4283214