Title :
Accurate Positioning of AFM Probe for AFM Based Robotic Nanomanipulation System
Author :
Tian, Xiaojun ; Wang, Yuechao ; Xi, Ning ; Dong, Zaili ; Li, Wenjung
Author_Institution :
Robotics Lab. of CAS, Shenyang Inst. of Auto.
Abstract :
For AFM based robotic nanomanipulation system without displacement sensor, one of the key technical problems is to realize high accurate positioning of the AFM probe. To solve the problem, based on the hysteresis and nonlinear characteristics analysis of AFM PZT actuator, a new actuating method called "actuating method based on reappearing the scanning trajectory" is presented to actuate the PZT actuator. Then two kinds of probe positioning errors, namely kinematics coupling errors due to the tube actuator\´s bend motion and probe tip\´s positioning errors caused by cantilever deflections, are compensated to further improve the probe\´s positioning accuracy. Nanopatterning experiments are performed to verify the effectiveness of the new actuating method and the compensation methods of probe positioning errors
Keywords :
atomic force microscopy; hysteresis; manipulator kinematics; micromanipulators; nanopositioning; piezoelectric actuators; AFM PZT actuator; AFM based robotic nanomanipulation system; AFM probe positioning; actuating method; atomic force microscope; cantilever deflections; hysteresis analysis; kinematics coupling errors; nanopatterning experiments; nonlinear characteristics analysis; probe tip positioning errors; scanning trajectory; tube actuator bend motion; Actuators; Content addressable storage; Hysteresis; Intelligent robots; Kinematics; Probes; Robot sensing systems; Robotics and automation; Sensor systems; Voltage; AFM probe positioning; Cantilever deflections; Kinematicss coupling errors; Nanomanipulation; Reappearing the scanning trajectory;
Conference_Titel :
Intelligent Robots and Systems, 2006 IEEE/RSJ International Conference on
Conference_Location :
Beijing
Print_ISBN :
1-4244-0259-X
Electronic_ISBN :
1-4244-0259-X
DOI :
10.1109/IROS.2006.282317