DocumentCode :
3177757
Title :
Constraint generation for software-based post-silicon bug masking with scalable resynthesis technique for constraint optimization
Author :
Chang, Chia-Wei ; Chou, Hong-Zu ; Chang, Kai-Hui ; Jiang, Jie-Hong Roland ; Liu, Chien-Nan Jimmy ; Hsiao, Chiu-Han ; Kuo, Sy-Yen
Author_Institution :
Electr. Eng. Dept., Nat. Central Univ., Jhongli, Taiwan
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
8
Abstract :
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification efforts and be detected after tape-out. While most existing solutions focus on fixing the problem on the hardware, in this work we propose a different methodology that tries to generate constraints which can be used to mask the bugs using software. This is achieved by utilizing formal reachability analysis to extract the conditions that can trigger the bugs. By synthesizing the bug conditions, we can derive input constraints for the software so that the hardware bugs will never be exposed. In addition, we observe that such constraints have special characteristics: they have small onset terms and flexible minterms. To facilitate the use of our methodology, we also propose a novel resynthesis technique to reduce the complexity of the constraints. In this way, software can be modified to run correctly on the buggy hardware, which can improve system quality without the high cost of respin.
Keywords :
circuit complexity; circuit optimisation; electronic engineering computing; integrated circuit reliability; logic design; masks; reachability analysis; silicon; bug detection; bug triggering; constraint optimization; design complexity; formal reachability analysis; hardware bugs; logic synthesis; scalable resynthesis technique; software-based post-silicon bug masking constraint generation; system quality; tape-out; Computer bugs; Hardware; Interpolation; Maintenance engineering; Optimization; Reachability analysis; Software; Bug repair; bug masking; logic synthesis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770722
Filename :
5770722
Link To Document :
بازگشت