DocumentCode
3178029
Title
A study of base grading effects on the steady-state current gain of heterojunction bipolar transistors
Author
Liou, J.J. ; Wong, W.W. ; Yuan, J.S.
Author_Institution
Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
fYear
1990
fDate
1-4 Apr 1990
Firstpage
982
Abstract
An analytical model is developed for the common-emitter DC current gain of heterojunction bipolar transistors with graded base for charge transport enhancement. Relevant device physics such as drift mechanism, current-induced base widening, and velocity overshoot are considered. It is shown that although base grading will often improve the device performance, it is sometimes disadvantageous for the current gain because the base grading may decrease the valence-band barrier height and thus increase the base current, resulting in a reduction in the current gain. Numerical simulations and measured dependencies published in the literature are included in support of the model
Keywords
heterojunction bipolar transistors; semiconductor device models; analytical model; base grading effects; charge transport enhancement; common-emitter DC current gain; current-induced base widening; drift mechanism; heterojunction bipolar transistors; steady-state current gain; valence-band barrier height; velocity overshoot; Current density; Doping; Electron mobility; Heterojunction bipolar transistors; Numerical simulation; Performance gain; Physics; Predictive models; Semiconductor process modeling; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '90. Proceedings., IEEE
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/SECON.1990.117967
Filename
117967
Link To Document