Title :
A study of base grading effects on the steady-state current gain of heterojunction bipolar transistors
Author :
Liou, J.J. ; Wong, W.W. ; Yuan, J.S.
Author_Institution :
Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
Abstract :
An analytical model is developed for the common-emitter DC current gain of heterojunction bipolar transistors with graded base for charge transport enhancement. Relevant device physics such as drift mechanism, current-induced base widening, and velocity overshoot are considered. It is shown that although base grading will often improve the device performance, it is sometimes disadvantageous for the current gain because the base grading may decrease the valence-band barrier height and thus increase the base current, resulting in a reduction in the current gain. Numerical simulations and measured dependencies published in the literature are included in support of the model
Keywords :
heterojunction bipolar transistors; semiconductor device models; analytical model; base grading effects; charge transport enhancement; common-emitter DC current gain; current-induced base widening; drift mechanism; heterojunction bipolar transistors; steady-state current gain; valence-band barrier height; velocity overshoot; Current density; Doping; Electron mobility; Heterojunction bipolar transistors; Numerical simulation; Performance gain; Physics; Predictive models; Semiconductor process modeling; Steady-state;
Conference_Titel :
Southeastcon '90. Proceedings., IEEE
Conference_Location :
New Orleans, LA
DOI :
10.1109/SECON.1990.117967