• DocumentCode
    3178029
  • Title

    A study of base grading effects on the steady-state current gain of heterojunction bipolar transistors

  • Author

    Liou, J.J. ; Wong, W.W. ; Yuan, J.S.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    1990
  • fDate
    1-4 Apr 1990
  • Firstpage
    982
  • Abstract
    An analytical model is developed for the common-emitter DC current gain of heterojunction bipolar transistors with graded base for charge transport enhancement. Relevant device physics such as drift mechanism, current-induced base widening, and velocity overshoot are considered. It is shown that although base grading will often improve the device performance, it is sometimes disadvantageous for the current gain because the base grading may decrease the valence-band barrier height and thus increase the base current, resulting in a reduction in the current gain. Numerical simulations and measured dependencies published in the literature are included in support of the model
  • Keywords
    heterojunction bipolar transistors; semiconductor device models; analytical model; base grading effects; charge transport enhancement; common-emitter DC current gain; current-induced base widening; drift mechanism; heterojunction bipolar transistors; steady-state current gain; valence-band barrier height; velocity overshoot; Current density; Doping; Electron mobility; Heterojunction bipolar transistors; Numerical simulation; Performance gain; Physics; Predictive models; Semiconductor process modeling; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '90. Proceedings., IEEE
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/SECON.1990.117967
  • Filename
    117967