Title :
On image-driven choice of wavelet basis for super resolution
Author :
Kumar, Neeraj ; Sethi, Amit
Author_Institution :
Dept. of Electron. & Electr. Eng., Indian Inst. of Technol., Guwahati, India
Abstract :
We move closer to deriving an image-driven criteria for the choice of wavelets for single image super resolution (SR). We start with the hypothesis that higher edge densities are better reconstructed by wavelets with higher number of vanishing moments and smaller support size. We examine SR performance of different wavelets on image categories with different amount of details. We use the slope of log power spectral density as a proxy for edge density. The results strengthen our hypothesis. We also interpret the results of two metrics and conclude that SSIM is a better perceptual metric than PSNR because it measures preservation of edge reconstruction. We use a TCEM model for estimating detail coefficients due to its previously reported superior performance.
Keywords :
edge detection; image reconstruction; image resolution; wavelet transforms; PSNR; SSIM; TCEM model; edge density; edge reconstruction; image categories; single image super resolution; wavelet basis image-driven choice; Hidden Markov models; Image edge detection; Image reconstruction; Image resolution; PSNR; Strontium; Wavelet transforms;
Conference_Titel :
Signal Processing and Communications (SPCOM), 2012 International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4673-2013-9
DOI :
10.1109/SPCOM.2012.6290026