• DocumentCode
    3178238
  • Title

    Crosstalk aware coupled line delay tree construction for on-chip interconnects

  • Author

    Samanta, Tuhina ; Khatun, Sanoara ; Rahaman, Hafizur ; Dasgupta, Parthasarathi

  • Author_Institution
    Bengal Eng. & Sci. Univ., Howrah, India
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Crosstalk noise dominates in deep submicron VLSI design as interconnects are more closely placed over a small layout area. Signal response and signal integrity is largely affected by crosstalk delay and noise. In this paper, we propose a coupled line delay model for on-chip interconnects during global routing, with crosstalk between wires as the parameter to be optimized. Our proposed model is influenced by moment matching model of a transmission line. We propose an algorithm for crosstalk aware delay tree construction, optimizing the effect of crosstalk delay in the tree structure by employing a cut - and - join strategy. Experiments are done on some benchmark instances with different technology parameters, and simulation results obtained are quite encouraging.
  • Keywords
    VLSI; crosstalk; integrated circuit design; integrated circuit interconnections; integrated circuit noise; network routing; transmission lines; trees (mathematics); benchmark instances; coupled line delay model; crosstalk aware coupled line delay tree construction; crosstalk aware delay tree construction; crosstalk delay; crosstalk noise; deep submicron VLSI design; global routing; moment matching model; on-chip interconnects; signal integrity; signal response; technology parameters; transmission line; tree structure; Capacitance; Couplings; Crosstalk; Delay; Integrated circuit interconnections; Integrated circuit modeling; Routing; Coupled line delay model; Delay tree; VLSI routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770750
  • Filename
    5770750