• DocumentCode
    3178240
  • Title

    2-die wafer-level chip scale packaging enables the smallest TCXO for mobile and wearable applications

  • Author

    Arumugam, Niveditha ; Hill, Ginel ; Clark, Guy ; Arft, Carl ; Grosjean, Charles ; Palwai, Rajkumar ; Pedicord, Jim ; Hagelin, Paul ; Partridge, Aaron ; Menon, Vinod ; Gupta, Pavan

  • Author_Institution
    SiTime Corp., Sunnyvale, CA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1338
  • Lastpage
    1342
  • Abstract
    Real-time clocking for space-constrained mobile and wearable applications require low-power 32.768 kHz references with small form-factor and tight frequency stability, at a competitive price built in an ultra-high volume capable manufacturing process. Legacy 32 kHz quartz-based technology has reached the limits of miniaturization, performance and cost. In this work, a temperature compensated 32 kHz MEMS-based oscillator (TCXO), in a 1.55 mm × 0.85 mm × 0.55 mm form factor, with ±5 ppm frequency stability over -40°C to 85°C, will be presented. The combination of wafer-level chip scale packaging (WL-CSP) and silicon MEMS technology has enabled the smallest and best-in-class 32 kHz clocking solution for very high volume applications. The underlying MEMS system packaging and test technologies will be presented along with the electrical and reliability results.
  • Keywords
    chip scale packaging; clocks; frequency stability; micromechanical devices; oscillators; quartz; wafer level packaging; MEMS system packaging; MEMS-based oscillator; TCXO; WL-CSP; frequency 32.768 kHz; frequency stability; microelectromechanical system; miniaturization performance; mobile application; quartz-based technology; real-time clocking; silicon MEMS technology; wafer-level chip scale packaging; wearable application; Application specific integrated circuits; Clocks; Electric shock; Micromechanical devices; Resonant frequency; Temperature measurement; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159771
  • Filename
    7159771