Title :
Dispersion measurement by white-light interferometry based on Fresnel reflections
Author :
Rothwell, J.H. ; Flavin, D.A.
Author_Institution :
Opt. Res. Group, Waterford Inst. of Technol., Ireland
Abstract :
In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.
Keywords :
light interferometry; light reflection; optical dispersion; optical variables measurement; Fresnel reflections; dispersion measurement; photonic materials characterisation; white-light interferometry; Delay; Dispersion; Fast Fourier transforms; Fresnel reflection; Optical filters; Optical interferometry; Optical sensors; Phase measurement; Ultrafast optics; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
DOI :
10.1109/CLEOE.2003.1313559
