• DocumentCode
    3178681
  • Title

    X-Ray Diffraction & Residual Stresses in Ferroelectric Cathodes

  • Author

    Ravi, M. ; Bhat, K.S. ; Krupanidhi, S.B.

  • Author_Institution
    Minstry of Defence, Bangalore
  • fYear
    2007
  • fDate
    15-17 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper we report an experimental study of electron emission from PLZT ceramic disc on application of high voltage excitation pulses and observed damage. Effect of 90deg domain switching on the internal stress developed in the ferroelectric sample has been studied through X-ray diffraction, d31 values were calculated from shift in XRD peaks.
  • Keywords
    X-ray diffraction; cathodes; electric domains; electron emission; ferroelectric ceramics; ferroelectric switching; internal stresses; lanthanum compounds; lead compounds; PLZT; X-ray diffraction; domain switching; electron emission; ferroelectric cathodes; ferroelectric ceramic disc; high-voltage excitation pulses; internal stress; residual stresses; Cathodes; Ceramics; Electron emission; Electron tubes; Ferroelectric materials; Iron; Residual stresses; Testing; X-ray diffraction; X-ray scattering; Electron Emission; XRD; ferroelectric cathodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2007. IVEC '07. IEEE International
  • Conference_Location
    Kitakyushu
  • Print_ISBN
    1-4244-0633-1
  • Type

    conf

  • DOI
    10.1109/IVELEC.2007.4283274
  • Filename
    4283274
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3178681