DocumentCode :
3178886
Title :
Bayesian surrogates for integrating numerical, analytical and experimental data: application to inverse heat transfer in wearable computers
Author :
Leoni, Napoleon ; Amon, Cristina
Author_Institution :
Dept. of Mech. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1998
fDate :
27-30 May 1998
Firstpage :
58
Lastpage :
67
Abstract :
The increasing thermal challenges facing compact systems have motivated new cooling strategies. Building models to assess design parameter effects is critical for effective incorporation of these thermal strategies into products. System models to enable design space exploration are built from various information sources, e.g. numerical simulations, experiments, analytical solutions and heuristics. These models, called surrogates, are nonlinear and adaptive and thus suitable for system responses where limited information is available and few realizations are feasible. In this paper, the surrogate framework is applied to estimate physical parameter values of an embedded electronics system. For this purpose, experiments and simulations are performed on a prototype TIA (technical information assistant) wearable computer. Numerical models are studied which use five and three unknown parameters, with and without thermal contact resistances, respectively. Using orthogonal arrays and optimal sampling, the parameter space exploration is performed to determine system parameters such as thermal conductivities, thermal contact resistances and heat transfer. Surrogate models are built that combine data from numerical simulations, experimental measurements, and a thermal resistance network simplified model. The integration of several information sources reduces the number of numerical simulations needed to find reliable system parameter estimates and allows identification of the best numerical model. For the embedded electronics case, use of the thermal resistance network model data greatly reduces computational effort required
Keywords :
Bayes methods; computer equipment testing; cooling; numerical analysis; parameter estimation; portable computers; thermal analysis; thermal conductivity; thermal management (packaging); thermal resistance; Bayesian surrogates; analytical data; analytical solutions; compact systems; computational effort; cooling strategies; data integration; design parameter effects models; design space exploration; embedded electronics system; experimental data; heat transfer; heuristics; information sources; inverse heat transfer; nonlinear adaptive models; numerical data; numerical model; numerical models; numerical simulation data; numerical simulations; optimal sampling; orthogonal arrays; parameter space exploration; physical parameter value estimation; prototype technical information assistant wearable computer; reliable system parameter estimation; surrogate framework; surrogate models; surrogates; system models; system parameters; system responses; technical information assistant; thermal conductivity; thermal contact resistance; thermal resistance network simplified model; wearable computers; Bayesian methods; Buildings; Cooling; Information analysis; Numerical models; Numerical simulation; Parameter estimation; Space exploration; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
ISSN :
1089-9870
Print_ISBN :
0-7803-4475-8
Type :
conf
DOI :
10.1109/ITHERM.1998.689520
Filename :
689520
Link To Document :
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