Title :
Evaluating a model of auditory masking for applications in audio coding
Author :
Espinoza-Varas, Blas ; Cherukuri, Surendra V.
Author_Institution :
Health Sci. Center, Oklahoma Univ., Oklahoma City, OK, USA
Abstract :
This investigation evaluates the adequacy of an excitation pattern (EP) model of auditory-masking to account for a masking condition commonly observed in the digital coding of audio signals: namely, the masking of quantization noise by either speech or musical sounds. This condition is modeled as a case of masking of a spectrally complex target by a multi-component complex masker (either speech or musical sounds). The evaluation focuses on the extent to which the EP model accounts for the 10-15 dB excess masking observed when multiple maskers occur simultaneously. Excitation-pattern predictions of the masking effects of two-component maskers were compared with predictions of masking-additivity models which closely predict experimental data. The EP model underestimates the combined effects of the two maskers both when the masker frequency components fall within the signal auditory-filter bandwidth, and when they fall outside this bandwidth. A correction for masking additivity may be needed prior to applying the EP model to audio-coding situations
Keywords :
audio coding; band-pass filters; filtering theory; hearing; music; prediction theory; quantisation (signal); speech coding; audio coding; audio signals; auditory masking model; digital coding; excitation pattern model; excitation pattern predictions; experimental data; masker frequency components; masking additivity models; multicomponent complex masker; musical sounds; quantization noise masking; signal auditory-filter bandwidth; spectrally complex target; speech coders; speech sounds; two-component maskers; Acoustic noise; Audio coding; Band pass filters; Bandwidth; Filter bank; Frequency; Predictive models; Quantization; Speech coding; Speech enhancement;
Conference_Titel :
Applications of Signal Processing to Audio and Acoustics, 1995., IEEE ASSP Workshop on
Conference_Location :
New Paltz, NY
Print_ISBN :
0-7803-3064-1
DOI :
10.1109/ASPAA.1995.482989