DocumentCode :
3178936
Title :
Maximizing throughput of temperature-constrained multi-core systems with 3D-stacked cache memory
Author :
Kang, Kyungsu ; Jung, Jongpil ; Yoo, Sungjoo ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Three-dimensional integration has the potential to increase integration density and to reduce communication latency of chip-multiprocessors (CMPs). However, high power density (i.e., power dissipation per unit volume) due to the high integration incurs temperature-related problems in reliability, power consumption, performance, and system cooling cost. In this paper, we propose a design-time solution for temperature-constrained multi-core systems with 3D stacked cache memory in order to maximize the instruction throughput. The proposed method combines power gating of memory banks in the 3D stacked cache memory, which adapts cache partitioning, and dynamic voltage and frequency scaling (DVFS) of each core in a temperature-aware manner. Experimental results show that the proposed method offers up to 32% (average 15%) performance improvement in terms of instructions per second (IPS) compared with an existing method which only performs cache partitioning without temperature consideration.
Keywords :
cache storage; microprocessor chips; multiprocessing systems; power aware computing; 3D stacked cache memory; cache partitioning; chip multiprocessor; communication latency reduction; design time solution; dynamic voltage scaling; frequency scaling; instruction per second; instruction throughput maximization; integration density; memory bank; power consumption; power gating; system cooling cost; temperature-aware manner; temperature-constrained multicore system; three dimensional integration; Benchmark testing; Cache memory; Clocks; Multicore processing; Radio spectrum management; Thermal resistance; Three dimensional displays; 3D integration; Chip-multiprocessor; Dynamic voltage and frequency scaling; Power gating; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770786
Filename :
5770786
Link To Document :
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