• DocumentCode
    3179026
  • Title

    BCH code based multiple bit error correction in finite field multiplier circuits

  • Author

    Poolakkaparambil, Mahesh ; Mathew, Jimson ; Jabir, Abusaleh M. ; Pradhan, Dhiraj K. ; Mohanty, Saraju P.

  • Author_Institution
    Dept. of Comp. Sci. & Electron., Oxford Brookes Univ., Oxford, UK
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a design methodology for multiple bit error detection and correction in Galois field arithmetic circuits such as the bit parallel polynomial basis (PB) multipliers over GF(2m). These multipliers are crucial in most of the cryptographic hardware designs and hence it is essential to ensure that they are not vulnerable to security threats. Security threats arising from injected soft (transient) faults into a cryptographic circuit can expose the secret information, e.g. the secret key, to an attacker. To prevent such soft or transient fault related attacks, we consider fault tolerance as a method of mitigation. Most of the current fault tolerant schemes are only multiple bit error detectable but not multiple bit error correctable. Keeping this in view, we present a multiple bit error correction scheme based on the BCH codes, with an efficient bit-parallel Chien search module. This paper details the design procedure as well as the hardware implementation specs. Comparison with existing methods demonstrate improved area, and reduced delay performances.
  • Keywords
    BCH codes; error correction codes; error detection codes; fault tolerance; logic design; multiplying circuits; BCH code; Galois field arithmetic circuits; bit error correction; bit parallel polynomial basis; bit-parallel Chien search module; cryptographic hardware designs; error detection; fault tolerance; finite field multiplier circuits; security threats; Circuit faults; Decoding; Error correction; Error correction codes; Generators; Hardware; Polynomials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770792
  • Filename
    5770792