Testing of one stage Pipelined Analog to Digital Converter

Analog to Digital converters are some of the most commonly used mixed-signal circuits nowadays. Testing such circuits has recently become extremely important. In this paper, a low-cost test is developed for a one-stage Pipelined Analog-to-Digital Converter (PADC). This circuit consists of one operational amplifier, one comparator, five transmission gates and two capacitors and is based on a 90 nm CMOS technology. By applying simple DC test inputs, it is shown that only two DC test values are enough to detect all catastrophic faults in the fault set. The Eldo simulator provided by Mentor Graphics was used in the analysis.