Testing of one stage Pipelined Analog to Digital Converter

Author

Hamed, Sahar M. ; Khalil, Ahmed H. ; Amer, Hassanein H. ; Abdelhalim, M.B. ; Madian, Ahmed H.

Author_Institution

Electron. & Commun. Dept., Cairo Univ., Cairo, Egypt

fYear

2011

fDate

Nov. 29 2011-Dec. 1 2011

Firstpage

193

Lastpage

198

Abstract

Analog to Digital converters are some of the most commonly used mixed-signal circuits nowadays. Testing such circuits has recently become extremely important. In this paper, a low-cost test is developed for a one-stage Pipelined Analog-to-Digital Converter (PADC). This circuit consists of one operational amplifier, one comparator, five transmission gates and two capacitors and is based on a 90 nm CMOS technology. By applying simple DC test inputs, it is shown that only two DC test values are enough to detect all catastrophic faults in the fault set. The Eldo simulator provided by Mentor Graphics was used in the analysis.

Keywords

CMOS integrated circuits; analogue-digital conversion; capacitors; circuit testing; comparators (circuits); mixed analogue-digital integrated circuits; operational amplifiers; CMOS technology; Eldo simulator; Mentor graphics; capacitors; comparator; mixed-signal circuits; operational amplifier; pipelined analog to digital converter; testing; transmission gates; CMOS integrated circuits; CMOS technology; Circuit faults; Logic gates; Nickel; Solids; Switches; PADC; catastrophic faults; fault model; mixed-signal testing; pipelined analog to digital converter; test coverage;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Engineering & Systems (ICCES), 2011 International Conference on

Conference_Location

Cairo

Print_ISBN

978-1-4577-0127-6

Type

conf

DOI

10.1109/ICCES.2011.6141040

Filename

6141040