DocumentCode :
3179278
Title :
Efficient checking of power delivery integrity for power gating
Author :
Zeng, Zhiyu ; Feng, Zhuo ; Li, Peng
Author_Institution :
Texas A&M Univ., College Station, TX, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
8
Abstract :
Multi-core architecture has emerged as the primary architectural choice to achieve power-efficient computing in microprocessors and SoCs. Power gating is indispensable for system power and thermal management and well suited for multi-core architectures. However, checking the power integrity (such as electromigration and voltage drop) of large gated power delivery networks (PDNs) presents a significant challenge due to the sheer die-package network complexity and the existence of an extremely large number of possible gating and operation configurations. We propose a simulation-based checking methodology that encompasses a comprehensive set of essential checking tasks. We tackle the challenges brought by the large checking space by developing strategies that efficiently identify top-ranked worst-case operating conditions, which are sequentially analyzed through a well-controlled number of full simulations for fidelity. We demonstrate the superior performance of the proposed approach on large power gating checking problems that are completely intractable to brute-force methods.
Keywords :
circuit complexity; microprocessor chips; multiprocessing systems; power aware computing; system-on-chip; PDN; SoC; large gated power delivery networks; microprocessor chip; multicore architecture; power delivery integrity checking; power gating; power management; power-efficient computing; sheer die-package network complexity; simulation-based checking methodology; thermal management; DVD; Integrated circuit modeling; Logic gates; Switching circuits; Transient analysis; Transistors; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770800
Filename :
5770800
Link To Document :
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