DocumentCode :
3179371
Title :
Investigation of tapered multiple microstrip lines for VLSI circuits
Author :
Mehalic, M.A. ; Chan, C.H. ; Mittra, R.
Author_Institution :
Electromagn. Commun. Lab., Illinois Univ., Urbana, IL, USA
fYear :
1988
fDate :
25-27 May 1988
Firstpage :
215
Abstract :
The S-parameters of coupled, tapered microstrip lines are calculated as function of frequency using an iteration-perturbation technique. Each tapered microstrip line is analyzed by dividing the line into small segments so that each segment can be approximated as a uniform line. For each frequency, starting with the static case, the effective dielectric constant, epsilon /sub r///sub eff/, is determined. This value is then used to compute the characteristic impedance of that section of line and the S-parameters are obtained using standard microwave analysis. The S-matrix is converted into a T-matrix, and since the sections are cascaded, all T-matrices are multiplied to drive a final T-matrix. This final T-matrix is then converted into an S-matrix, which is frequency dependent, and the mismatch introduced by the taper is obtained from the S-matrix.<>
Keywords :
S-parameters; VLSI; strip lines; S-parameters; T-matrices; VLSI circuits; characteristic impedance; effective dielectric constant; iteration-perturbation technique; mismatch; segments; tapered multiple microstrip lines; Circuits; Electromagnetic coupling; Etching; Frequency dependence; Impedance; Matrix converters; Microstrip; Scattering parameters; Transmission line matrix methods; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/MWSYM.1988.22016
Filename :
22016
Link To Document :
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