DocumentCode :
3179510
Title :
Scaled LTPS TFTs for low-cost low-power applications
Author :
Kim, Soo Youn ; Baytok, Selin ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Low-temperature polycrystalline-silicon thin-film transistors (LTPS TFTs) have emerged as a promising technology for applications such as low-cost sensor networks. In this paper, we propose a LTPS TFT device optimization methodology based on scaling of silicon body (Tsi) and buried oxide thickness (Tbox). The proposed approach is applicable for both digital and analog circuits. Results show that using the proposed device we can achieve 133X improvement in oscillation frequency of a three-stage ring oscillator (RO) and 31% improvement in operational amplifier (OPAMP) gain (Tsi =10nm and Tbox =10nm) compared to the traditional device structures. We believe that proper optimization of TFT device geometry parameters is necessary to realize low-power, high-performance, and low-cost LTPTS TFT digital & analog/RF circuits.
Keywords :
circuit optimisation; elemental semiconductors; low-power electronics; operational amplifiers; radiofrequency oscillators; silicon; thin film transistors; Si; analog-RF circuits; buried oxide thickness; digital circuits; low-cost low-power electronics; low-cost sensor networks; low-temperature polycrystalline-silicon thin-film transistors; opamp gain; operational amplifier; oscillation frequency; scaled LTPS TFT device optimization methodology; silicon body scaling; three-stage ring oscillator; Analog circuits; Capacitance; Logic gates; Performance evaluation; Silicon; Thin film transistors; BOX (buried oxide); Buried-oxide Induced Barrier Lowering (BIBL); Drain Induced Barrier Lowering (DIBL); Thin Film Transistor (TFT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770812
Filename :
5770812
Link To Document :
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