DocumentCode
3180028
Title
Height Ridge Computation and Filtering for Visualization
Author
Peikert, Ronald ; Sadlo, Filip
Author_Institution
ETH Zurich, Zurich
fYear
2008
fDate
5-7 March 2008
Firstpage
119
Lastpage
126
Abstract
Motivated by the growing interest in the use of ridges in scientific visualization, we analyze the two height ridge definitions by Eberly and Lindeberg. We propose a raw feature definition leading to a superset of the ridge points as obtained by these two definitions. The set of raw feature points has the correct dimensionality, and it can be narrowed down to either Eberly´s or Lindeberg´s ridges by using Boolean filters which we formulate. While the straight-forward computation of height ridges requires explicit eigenvalue calculation, this can be avoided by using an equivalent definition of the raw feature set, for which we give a derivation. We describe efficient algorithms for two special cases, height ridges of dimension one and of co-dimension one. As an alternative to the aforementioned filters, we propose a new criterion for filtering raw features based on the distance between contours which generally makes better decisions, as we demonstrate on a few synthetic fields, a topographical dataset, and a fluid flow simulation dataset. The same set of test data shows that it is unavoidable to use further filters to eliminate false positives. For this purpose, we use the angle between feature tangent and slope line as a quality measure and, based on this, formalize a previously published filter.
Keywords
Boolean functions; data visualisation; eigenvalues and eigenfunctions; filtering theory; Boolean filter; Eberly height ridge computation; Lindeberg height ridge computation; eigenvalue calculation; feature point; scientific visualization; Computational modeling; Computer vision; Data visualization; Eigenvalues and eigenfunctions; Filtering; Filters; Fluid flow; Integral equations; Surface topography; Testing; I.3.8 [Computer Graphics]: Applications; I.4.6 [Image Processing and Computer Vision]: Segmentation¿Edge and feature detection; J.2 [Physical Sciences and Engineering]: Engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Visualization Symposium, 2008. PacificVIS '08. IEEE Pacific
Conference_Location
Kyoto
Print_ISBN
978-1-4244-1966-1
Type
conf
DOI
10.1109/PACIFICVIS.2008.4475467
Filename
4475467
Link To Document