Title :
An advanced cluster analysis method based on statistical test
Author :
Gao, Xinbo ; Ji, Hongbing ; Li, Jie
Author_Institution :
Sch. of Electron. Eng., Xidian Univ., Xi´´an, China
Abstract :
The paper presents a novel clustering algorithm supervised by statistical tests. It deals simultaneously with three key data analysis problems: cluster tendency; cluster analysis; cluster validity. It provides an effective tool to analyze the validity and reasonableness of unsupervised pattern classification, especially in the case of a large number of samples. The experimental result illustrates its effectiveness.
Keywords :
pattern classification; pattern clustering; set theory; statistical analysis; cluster analysis method; cluster tendency; cluster validity; clustering algorithm; multi-variable statistical analysis; pattern clustering; statistical test; unlabelled pattern set; unsupervised classification; unsupervised pattern classification; Clustering algorithms; Data analysis; Density functional theory; Electronic equipment testing; Partitioning algorithms; Pattern analysis; Pattern clustering; Pattern recognition; Performance analysis; Statistical analysis;
Conference_Titel :
Signal Processing, 2002 6th International Conference on
Print_ISBN :
0-7803-7488-6
DOI :
10.1109/ICOSP.2002.1179981
