On-wafer characterization of monolithic millimeter-wave integrated circuits by a picosecond optical electronic technique

Author

Polak-Dingels, P. ; Hung, H.-L.A. ; Smith, T. ; Huang, H.C. ; Webb, K.J. ; Lee, C.H.

Author_Institution

Lab. for Phys. Sci., College Park, MD, USA

fYear

1988

fDate

25-27 May 1988

Firstpage

237

Abstract

A picosecond optical electronic sampling technique for the characterization of monolithic microwave integrated circuits (MMICs) has been developed. The measured time-domain response allows the spectral transfer function of the MMIC to be obtained. This technique was applied to characterize the frequency response of a two-stage Ka-band MMIC amplifier. The broadband results agree well with those obtained by conventional network analyzer measurements.<>

Keywords

microwave amplifiers; microwave integrated circuits; monolithic integrated circuits; Ka-band; MMICs; frequency response; monolithic millimeter-wave integrated circuits; picosecond optical electronic technique; sampling technique; spectral transfer function; time-domain response; Integrated optics; MMICs; Microwave integrated circuits; Microwave theory and techniques; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Photonic integrated circuits; Sampling methods; Stimulated emission;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1988., IEEE MTT-S International

Conference_Location

New York, NY, USA

Type

conf

DOI

10.1109/MWSYM.1988.22021

Filename

22021