• DocumentCode
    3180583
  • Title

    Optical transitions in new semiconductor alloy GaAs1-xBi x with temperature-insensitive band gap

  • Author

    Yoshida, Junichi ; Yamamizu, Hideaki ; Kita, Takashi ; Oe, Kunishige

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    109
  • Lastpage
    112
  • Abstract
    We performed photoreflectance (PR) spectroscopy in order to investigate fundamental band-edge transitions of GaAs1-xBi x alloys. GaBi-mole fractions of GaAs1-xBix investigated in this study are 0, 0.005, 0.012 and 0.024. The PR spectra for the four samples exhibit Franz-Keldysh oscillations (FKO) above the band-gap energy due to the built-in electric field. The FKO signal enables us to evaluate the band-gap energy. We found that a small amount of the Bi content succeeds in producing a temperature-insensitive band gap. The reduced effective mass ratio between the heavy- and light-hole bands μhhlh was estimated by fast Fourier-transform analysis for the PR spectra. These results show that μhhlh is larger for higher Bi content
  • Keywords
    III-V semiconductors; MOCVD coatings; band structure; effective mass; energy gap; fast Fourier transforms; gallium arsenide; photoreflectance; semiconductor epitaxial layers; visible spectra; Franz-Keldysh oscillations; GaAs1-xBix; GaAsBi; GaBi-mole fractions; MOVPE growth; PR spectra; band-gap energy; built-in electric field; effective mass ratio; fast Fourier-transform analysis; fundamental band-edge transitions; heavy-hole bands; light-hole bands; optical transitions; photoreflectance spectroscopy; temperature-insensitive band gap; Bismuth; Effective mass; Epitaxial growth; Epitaxial layers; Fiber lasers; Gallium arsenide; Photonic band gap; Semiconductor lasers; Semiconductor materials; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
  • Conference_Location
    Nara
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6700-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2001.929030
  • Filename
    929030