Title :
Nonlinearity and response speed evaluation of intersubband transition in InGaAs/AlAsSb quantum well
Author :
Gopal, A.V. ; Yoshida, H. ; Akiyama, T. ; Neogi, A. ; Mozume, T. ; Georgiev, N. ; Wada, O.
Author_Institution :
FESTA Labs., Femtosecond Technol. Res. Assoc., Tsukuba, Japan
Abstract :
We report the first reliable estimate of the saturation intensity in InGaAs/AlAsSb quantum wells using the homogeneous linewidth estimated from a careful lineshape analysis of the absorption spectra recorded as a function of temperature and the pump-probe relaxation time (τ≈2.1 psec) at room temperature. The estimated value of saturation intensity is 52±5 MW cm2 at an excitation wavelength of 1.92 μm. We performed a direct saturation measurement to estimate the linear absorption coefficient (α0) and the 3rd order susceptibility (χ(3)). We observed a giant χ(3) of about 8.2×10-15 m2/V 2. The linear absorption coefficient is evaluated to be 3370 cm-1. From these values we estimated the figure of merit to be 1.2×10-8 m3 V-2s-1 in this material
Keywords :
III-V semiconductors; absorption coefficients; aluminium compounds; gallium arsenide; high-speed optical techniques; indium compounds; infrared spectra; nonlinear optical susceptibility; optical saturable absorption; optical switches; semiconductor quantum wells; spectral line breadth; 1.92 mum; 2.1 ps; In0.53Ga0.47As-AlAs0.56Sb 0.44; InGaAs-AlAsSb; InGaAs/AlAsSb quantum well; absorption spectra; excitation wavelength; figure of merit; homogeneous linewidth; intersubband transition; linear absorption coefficient; lineshape analysis; nonlinearity; pump-probe relaxation time; response speed evaluation; room temperature; saturation intensity; third order susceptibility; ultrafast all-optical switches; Absorption; Communication switching; Data mining; Indium gallium arsenide; Optical materials; Optical switches; Pulse measurements; Temperature; Ultrafast optics; Wavelength measurement;
Conference_Titel :
Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
Conference_Location :
Nara
Print_ISBN :
0-7803-6700-6
DOI :
10.1109/ICIPRM.2001.929031