DocumentCode :
3180635
Title :
Perspective for large semi-insulating indium phosphide substrates
Author :
Ware, Rowland
Author_Institution :
M/A-COM Inc., Lowell, MA, USA
fYear :
2001
fDate :
2001
Firstpage :
121
Lastpage :
124
Abstract :
The increasing use of InP for microwave and millimeter wave devices requires an assured supply of good quality 3 inch and 100 mm semi-insulating substrates. This paper considers the current availability of such wafers, the raw material situation and the properties of wafers grown by different processes. It includes a detailed discussion of ingot annealing and the advantages it offers in terms of material uniformity and reduced breakages. It is suggested that the improvement in electrical uniformity is obtained by the redistribution of the defect VIn-H4. Improvements in quality and reduction in price should occur as production volume increases
Keywords :
III-V semiconductors; annealing; indium compounds; microwave materials; substrates; 100 mm; 3 inch; InP; VIn-H4 defect distribution; electrical uniformity; ingot annealing; microwave device; millimeter-wave device; raw material; semi-insulating indium phosphide substrate; volume production; wafer growth; Gallium arsenide; Gallium compounds; III-V semiconductor materials; Indium phosphide; Light emitting diodes; Manufacturing; Microwave devices; Millimeter wave devices; Raw materials; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
Conference_Location :
Nara
ISSN :
1092-8669
Print_ISBN :
0-7803-6700-6
Type :
conf
DOI :
10.1109/ICIPRM.2001.929033
Filename :
929033
Link To Document :
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