• DocumentCode
    3180643
  • Title

    InGaAs ternary bulk crystal growth method using InGaAs ternary source

  • Author

    Nisjima, Y. ; Akasaka, Osamu ; Nakajima, Kazuo ; Otsubo, Koji ; Ishikawa, Hiroshi

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    We have developed a new zone growth method using an InGaAs ternary source to obtain an InxGa1-xAs (x~0.3) long single crystal. A seed used for the zone growth method is an InGaAs crystal grown on a (100) GaAs seed by the vertical gradient freeze technique. The new zone growth method is different from the conventional zone growth one in two respects. (1) The source material is changed from GaAs to InGaAs, because the use of a GaAs source causes the lack of InAs in the melt during the zone crystal growth, an InGaAs source is produced by quenching an InxGa1-xAs (x~0.3) melt. (2) No isolation plate for reducing the supply rate of the source into the melt is inserted between the source material and the melt. The supply rate of the source is reduced by restraining the convection due to inverting positions of an InGaAs seed and a source material. The InGaAs zone crystal obtained was 15 mm long and the InAs composition (x) was around 0.27. The single crystal region was 8 mm long. The best value of the full widths of the half maximums of the (400) X-ray diffraction peaks was 20 seconds
  • Keywords
    III-V semiconductors; X-ray diffraction; gallium arsenide; indium compounds; semiconductor growth; zone melting; GaAs(100) seed; InxGa1-xAs single crystal; InGaAs; InGaAs crystal seed; InGaAs ternary bulk crystal growth; InGaAs ternary source; X-ray diffraction; vertical gradient freeze technique; zone growth method; Crystalline materials; Crystals; Gallium arsenide; Indium gallium arsenide; Indium phosphide; Laboratories; Lattices; Substrates; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
  • Conference_Location
    Nara
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6700-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2001.929034
  • Filename
    929034