• DocumentCode
    3180672
  • Title

    Analysis of the snubberless operation of the emitter turn-off thyristor (ETO)

  • Author

    Li, Yuxin ; Huang, Alex ; Motto, Kevin

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    238
  • Abstract
    The emitter turn-off thyristor (ETO) is a GTO-MOSFET hybrid power semiconductor device that turns off the GTO under the unity turn-off gain condition. This paper analyzes the failure mechanism in the snubberless turn-off of the ETO and proposes solutions that extend the snubberless switching capability to the theoretical limitation of the device. Theoretical analysis and experimental results are presented
  • Keywords
    failure analysis; power semiconductor switches; semiconductor device models; semiconductor device reliability; thyristors; GTO-MOSFET hybrid power semiconductor device; emitter turn-off thyristor; failure mechanism; snubberless operation analysis; snubberless switching capability; snubberless turn-off; unity turn-off gain condition; Cathodes; Equivalent circuits; Failure analysis; Power semiconductor devices; Power semiconductor switches; Snubbers; Temperature; Thyristors; Turning; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Drive Systems, 1999. PEDS '99. Proceedings of the IEEE 1999 International Conference on
  • Print_ISBN
    0-7803-5769-8
  • Type

    conf

  • DOI
    10.1109/PEDS.1999.794567
  • Filename
    794567