DocumentCode :
3180742
Title :
Integrated flow-thermomechanical and reliability analysis of a densely packed C4/CBGA assembly
Author :
Hong, Bor Zen ; Yuan, Tsorng-Dih
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1998
fDate :
27-30 May 1998
Firstpage :
220
Lastpage :
228
Abstract :
This paper presents an integrated flow-thermomechanical and reliability analysis of a C4/ceramic ball grid array (CBGA) under a mini power-cycled load of 0 to 5 W at a frequency of 3 cycles per hour. A computational fluid dynamics model was used for conjugate conduction-convection heat transfer analysis to determine the local heat transfer coefficients of the package under various low air flow conditions of 0.5 to 2.0 m/s. The determined local heat transfer coefficients were specified as the thermal boundary conditions in a thermomechanical model for transient heat transfer and nonlinear thermal stress analyses to predict the local temperature profiles and associated viscoplastic deformation of CBGA solder joints. By using a deformation base lifetime analysis method, the predicted mean fatigue life of the power-cycled solder joints is compared to that of the temperature-cycled solder joints under a 0/100°C load. Predictions of temperature-cycled solder mean life show good agreement with experimental data. Analysis shows that the leading edge and trailing edge CBGA solder joints in the package have different fatigue behaviour. This air flow induced orientation effect grows significantly as the air flow velocity increases. Both temperature-cycled and power-cycled solder fatigue results were used to estimate the equivalent solder fatigue lives of the C4/CBGA packages with application to laptop and desktop computer systems at an average on-off temperature rise ΔT of 20°C and 30°C
Keywords :
ball grid arrays; ceramic packaging; computational fluid dynamics; convection; cooling; fatigue; heat conduction; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; plastic deformation; stress analysis; thermal analysis; thermal management (packaging); thermal stresses; 0 to 100 C; 0 to 5 W; 0.5 to 2 m/s; C4/CBGA packages; C4/ceramic BGA; C4/ceramic ball grid array; CBGA solder joints; air flow conditions; air flow induced orientation effect; air flow velocity; average on-off temperature rise; computational fluid dynamics model; conjugate conduction-convection heat transfer analysis; deformation base lifetime analysis method; densely packed C4/CBGA assembly; desktop computer systems; equivalent solder fatigue life; fatigue; flow-thermomechanical analysis; integrated flow-thermomechanical/reliability analysis; laptop computer systems; leading edge CBGA solder joints; local heat transfer coefficients; local temperature profiles; mean fatigue life; nonlinear thermal stress analysis; package; power-cycled load; power-cycled solder fatigue; power-cycled solder joints; reliability analysis; temperature-cycled solder fatigue; temperature-cycled solder joints; temperature-cycled solder mean life; thermal boundary conditions; thermomechanical model; trailing edge CBGA solder joints; transient heat transfer analysis; viscoplastic deformation; Ceramics; Computational fluid dynamics; Electronics packaging; Fatigue; Frequency; Heat transfer; Load flow analysis; Soldering; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
ISSN :
1089-9870
Print_ISBN :
0-7803-4475-8
Type :
conf
DOI :
10.1109/ITHERM.1998.689548
Filename :
689548
Link To Document :
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