Title :
Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes
Author :
Sun, Wen ; Zheng, Xiaoquan ; Campbell, Joe C.
Author_Institution :
Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA
Abstract :
Avalanche photodiodes with thin multiplication regions exhibit a linear relationship between F(M) and M, which differs from the local-field model. This letter presents a study of the relationship between F(M) with M when nonlocal effects are significant. Systematic Monte Carlo simulations on different avalanche photodiodes have been carried out to support the analytical model.
Keywords :
Avalanche photodiodes; Impact ionization; Monte Carlo methods; Noise; Avalanche photodiode; Monte Carlo simulation; excess noise factor; impact ionization;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2014.2348914
