Title :
A method to measure EMI due to electric field coupling on PCB
Author :
Pong, Bryan M H ; Lee, Angus C M
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Abstract :
A new method to measure electric field coupling between PCB copper traces is presented. This method enables measurement of noise from waveforms obtainable from breadboard prototypes, which is available in an early stage in the design process. The measurement result can then be analyzed and provide information for further PCB design. This method is verified by experiments and applied to an off-line flyback converter
Keywords :
DC-DC power convertors; electric fields; electric noise measurement; electromagnetic interference; printed circuit layout; EMI measurement; PCB copper traces; PCB design; breadboard prototype waveforms; electric field coupling; noise measurement; off-line flyback converter; Circuit testing; Conductors; Coupling circuits; Design engineering; Electric variables measurement; Electromagnetic interference; Magnetic field measurement; Noise measurement; Prototypes; Voltage;
Conference_Titel :
Power Conversion Conference - Nagaoka 1997., Proceedings of the
Conference_Location :
Nagaoka
Print_ISBN :
0-7803-3823-5
DOI :
10.1109/PCCON.1997.638393
