Title :
Using industry-grade test equipment in a digital test and product engineering lab course
Author :
Miller, Christopher ; Hudson, Tina A. ; Sipes, Shannon
Author_Institution :
Dept. of Electr. & Comput. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN, USA
Abstract :
This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master´s-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.
Keywords :
automatic test equipment; educational courses; engineering education; digital core courses; digital testing; industry-grade automatic test equipment; product engineering lab course; test engineering; Circuit faults; Industries; Microcontrollers; Programming; Random access memory; Testing; Timing; critical thinking skills; digital systems; embedded systems testing; hands-on learning; labs; test engineering;
Conference_Titel :
Microelectronics Systems Education (MSE), 2015 IEEE International Conference on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-1-4799-9913-2
DOI :
10.1109/MSE.2015.7160006
