Raman spectra analysis of MWCNTs based on Empirical Model Decomposition

Microwave Plasma Chemical Vapor Deposition (MPCVD) method can be used to grow various kinds of diamond films and carbon nanotubes at various temperatures. Manufacturing parameters, such as gas flow rate, input microwave power, working distance, deposition time, chamber pressure and substrate temperature, were all fixed to grow multiwalled carbon nanotubes (MWCNTs). To grow MWCNTs of better quality with a self-assembled MPCVD system, the quality indexes of MWCNTs, which are the aspect ratio of MWCNTs and the ID/IG intensity ratio of the Raman spectrum of MWCNTs, were analyzed. In this paper, we present a proposed method for analyzing Raman spectra of Functionalized MWCNTs by using Empirical Model Decomposition (EMD). The performances of the method are compared with those provided with the Gaussian/Lorentz fitting method. The results show that the proposed method performs a good decomposition for identifying D band and G band pattern in MWCNTs.