• DocumentCode
    3181398
  • Title

    Satisfying ABET criterion using an industrial Microelectronic Skills Incubator

  • Author

    Swabey, Matthew A. ; Johnson, Mark C.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2015
  • fDate
    20-21 May 2015
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    An undergraduate System-on-Chip (SoC) design group modelled after industry provides a rich environment for students to achieve most ABET outcomes while working in a variety of classes. The Microelectronic Skills Incubator engages a team of primarily undergraduates in the process of iteratively improving, prototyping, fabricating, and testing an ARM® DesignStart™ Cortex®-M0 based SoC. Two versions of the chip have been fabricated so far, the first time unsuccessfully, but the second time silicon was obtained which executes code and drives peripheral. Production of working silicon is exciting, but it also creates strong incentives much as it does in industry to re-use intellectual property (IP), use well-defined standard interfaces, and verify the design thoroughly before fabrication. This paper documents the steps taken to create the incubator, the experiences provided to students, and it details the ways in which students meet or exceed most ABET outcomes for an ECE program.
  • Keywords
    educational courses; educational institutions; engineering education; integrated circuits; knowledge management; system-on-chip; ABET criterion; ARM DesignStart Cortex-MO based SoC; ECE; SoC design group; engineering education; industrial microelectronic skills incubator; intellectual property; undergraduate system-on-chip design group; Fabrication; Industries; Knowledge engineering; Random access memory; Software; Standards; System-on-chip; ABET; Education courses; Engineering education; Industry; System-on-Chip and VLSI;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Systems Education (MSE), 2015 IEEE International Conference on
  • Conference_Location
    Pittsburgh, PA
  • Print_ISBN
    978-1-4799-9913-2
  • Type

    conf

  • DOI
    10.1109/MSE.2015.7160010
  • Filename
    7160010