Title :
A FEM-based nonlinear MAP estimator in electrical impedance tomography
Author :
Martin, Thierry ; Idier, Jérôme
Author_Institution :
Lab. des Signaux et Syst., CNRS, Gif-sur-Yvette, France
Abstract :
Electrical impedance tomography of closed conductive media is an ill-posed inverse problem. Using the finite elements method to solve the corresponding direct problem allows one to preserve the nonlinear dependence of the observation set upon the conductivity distribution. We show that the Bayesian approach presented by Demoment (1989) for linear inverse imaging problems is still valid for such a nonlinear inverse problem. Our contribution is based on an edge-preserving Markov model as a prior for conductivity distribution. Maximum a posteriori reconstruction results from 40-dB noisy measurements (simulated with a finer mesh) yield significant resolution improvement compared to classical methods
Keywords :
Bayes methods; Markov processes; electric admittance; electric impedance; finite element analysis; image reconstruction; image resolution; inverse problems; maximum likelihood estimation; tomography; Bayesian approach; FEM-based nonlinear MAP estimator; MAP estimator; closed conductive media; conductivity distribution; edge-preserving Markov model; electrical impedance tomography; finite elements method; ill-posed inverse problem; linear inverse imaging problems; maximum a posteriori reconstruction; noisy measurements; nonlinear dependence; nonlinear inverse problem; observation set; resolution; Bayesian methods; Conductivity; Current measurement; Finite element methods; Image reconstruction; Impedance; Inverse problems; Maxwell equations; Nonlinear equations; Surface reconstruction; Tomography; Voltage;
Conference_Titel :
Image Processing, 1997. Proceedings., International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-8186-8183-7
DOI :
10.1109/ICIP.1997.638588