Title : 
Solder Fatigue Study through Finite Element Analysis in a Molded Board Level BGA Module
         
        
            Author : 
Zhang, Jack ; Ji, Qing ; Rector, Lou
         
        
            Author_Institution : 
Henkel Technol., Irvine
         
        
        
        
        
        
            Abstract : 
Eutectic solders are prone to cold flow and creep in thermal cycle process and therefore prone to fatigue failures. In this paper, eutectic solder fatigue in a molded board level BGA module was studied through finite element analysis. Particularly, the effects of underfilling molding compounds to the stresses and fatigue life of solder balls were investigated. A global finite element model was built to map out the most likely first-fail solder ball. The life cycle of this solder ball was further studied through a more detailed localized finite element model. Improvement of the fatigue life of this solder ball was investigated through optimizing materials properties of the underfilling molding compound.
         
        
            Keywords : 
ball grid arrays; eutectic alloys; finite element analysis; solders; board level BGA module; cold flow; eutectic solders; fatigue failures; fatigue life; finite element analysis; solder balls; solder fatigue; thermal cycle process; Capacitive sensors; Creep; Fatigue; Finite element methods; Flip chip; Packaging; Protection; Temperature; Testing; Thermal stresses;
         
        
        
        
            Conference_Titel : 
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
         
        
            Conference_Location : 
Shanghai
         
        
            Print_ISBN : 
1-4244-1253-6
         
        
            Electronic_ISBN : 
1-4244-1253-6
         
        
        
            DOI : 
10.1109/HDP.2007.4283570