Title :
Effect of out-of-plane material behavior on in-plane modeling
Author :
Manjula, S. ; Sitaraman, Suresh K.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In the analysis of the thermo-mechanical behavior of multi-layered structures in electronic packages, three-dimensional (3D) models often serve as the most accurate representations. However, 3D analyses are usually computationally intensive and time-consuming. Therefore, two-dimensional (2D) models with appropriate assumptions and boundary conditions are often used in the thermomechanical analysis of electronic packaging assemblies. A significant cause for concern for such 2D simplification is the role of the out-of-plane coefficient of thermal expansion. This paper analyzes the role of the out-of-plane CTE in thermo-mechanical modeling through the use of plane-strain, plane-stress, 3D, and generalized deformation numerical models along with closed-form analytical formulations. A special plane-strain case with the out-of-plane CTE set to be zero has also been studied
Keywords :
deformation; electronic engineering computing; numerical analysis; stress analysis; thermal analysis; thermal expansion; thermal management (packaging); thermal stresses; 2D model assumptions; 2D model boundary conditions; 2D models; 3D models; 3D numerical model; closed-form analytical formulation; computationally intensive 3D analysis; electronic packages; electronic packaging assemblies; generalized deformation numerical model; in-plane modeling; multi-layered structures; out-of-plane CTE; out-of-plane coefficient of thermal expansion; out-of-plane material behavior effects; plane-strain numerical model; plane-stress numerical model; special plane-strain case; thermo-mechanical behavior; thermo-mechanical modeling; thermomechanical analysis; Assembly; Capacitive sensors; Electronic packaging thermal management; Electronics packaging; Laminates; Numerical models; Solid modeling; Thermal expansion; Thermal stresses; Thermomechanical processes;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4475-8
DOI :
10.1109/ITHERM.1998.689557