• DocumentCode
    3182328
  • Title

    A CMOS enhanced solid-state nanopore based single molecule detection platform

  • Author

    Chinhsuan Chen ; Yemenicioglu, Sukru ; Uddin, Ahsan ; Corgliano, Ellie ; Theogarajan, Luke

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    164
  • Lastpage
    167
  • Abstract
    Solid-state nanopores have emerged as a single molecule label-free electronic detection platform. Existing transimpedance stages used to measure ionic current nanopores suffer from dynamic range limitations resulting from steady-state baseline currents. We propose a digitally-assisted baseline cancellation CMOS platform that circumvents this issue. Since baseline cancellation is a form of auto-zeroing, the 1/f noise of the system is also reduced. Our proposed design can tolerate a steady state baseline current of 10μA and has a usable bandwidth of 750kHz. Quantitative DNA translocation experiments on 5kbp DNA was performed using a 5nm silicon nitride pore using both the CMOS platform and a commercial system. Comparison of event-count histograms show that the CMOS platform clearly outperforms the commercial system, allowing for unambiguous interpretation of the data.
  • Keywords
    1/f noise; CMOS integrated circuits; DNA; bioelectric phenomena; molecular biophysics; nanobiotechnology; 1/f noise; CMOS enhanced single molecule detection platform; bandwidth 750 kHz; current 10 muA; digitally assisted baseline cancellation CMOS platform; ionic current nanopores; label free electronic detection platform; quantitative DNA translocation; solidstate nanopore based single molecule detection platform; steady state baseline currents; transimpedance stages; Bandwidth; CMOS integrated circuits; Current measurement; DNA; Dynamic range; Nanobioscience; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6609463
  • Filename
    6609463