DocumentCode
3182913
Title
Finite Element Analysis and Fatigue Life Prediction of BGA Mixed Solder Joints
Author
Ting-Biao, Jiang ; Du Chao ; Long-Hui, Xu
Author_Institution
Sch. of Mech. Electr. Eng., Guilin Univ. of Electron. Technol., Guilin
fYear
2007
fDate
26-28 June 2007
Firstpage
1
Lastpage
6
Abstract
To protect the environment and enhance the human health, the lead-free process is speeded up rapidly in recent years. However, on the way to lead-free process, lead and lead-free materials will be used within the same mounting process for the manufacturers of electronic products. Therefore it is necessary to study the reliability of the mixed solder joints. Based on BGA device, this paper analyzes the reliability of the mixed solder joints with thermal cycling loading by ANSYS software, and predicts the thermal fatigue life of the joints by modified Coffin-Manson equation. The order of the thermal fatigue life of the joints is: lead-free solder joints >FWC solder joints >BWC solder joints (uniform structure) >lead solder joints >BWC solder joints (non-uniform structure). A case study is given. The result shows that the reliability of lead-free solder joints and mixed solder joints (uniform structure) are better than that of lead solder joints.
Keywords
ball grid arrays; fatigue testing; finite element analysis; reliability; soldering; thermal management (packaging); ANSYS software; BGA mixed solder joints; electronic products; finite element analysis; lead-free process; modified Coffin-Manson equation; solder joint reliability; thermal cycling loading; thermal fatigue life prediction; Environmentally friendly manufacturing techniques; Equations; Fatigue; Finite element methods; Humans; Lead; Manufacturing processes; Protection; Soldering; Thermal loading; BGA; backwards compatible solder joint; finite element analysis; forwards compatible solder joint; thermal fatigue life;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
Conference_Location
Shanghai
Print_ISBN
1-4244-1252-8
Electronic_ISBN
1-4244-1253-6
Type
conf
DOI
10.1109/HDP.2007.4283611
Filename
4283611
Link To Document