DocumentCode
3182949
Title
Atomic hydrogen assisted selective MBE growth of InGaAs ridge quantum wire honeycomb network structures for binary-decision diagram quantum LSIs
Author
Ito, Akira ; Muranaka, Tsutomu ; Kasai, Seiya ; Hasegawa, Hideki
Author_Institution
Graduate Sch. of Electron. & Inf. Eng., Hokkaido Univ., Sapporo, Japan
fYear
2001
fDate
2001
Firstpage
521
Lastpage
524
Abstract
Novel hexagonal quantum circuits based on the binary-decision diagram (BDD) architecture have been recently proposed by our group towards next generation quantum LSIs (Q-LSIs) operating at room temperature. In this paper, feasibility of InGaAs ridge quantum wire (QWR) honeycomb network structures for such quantum circuits is investigated using atomic hydrogen (H*)-assisted selective MBE. The fabricated structures were characterized in detail by SEM, AFM, PL and CL measurements. By using patterned substrates with wire directions of <100>-<1¯10> and <510>-<1¯10> together with optimized H*-assisted selective MBE, honeycomb networks of the sharp and uniform InGaAs ridge structures were realized. Embedded InGaAs QWR honeycomb networks were successfully formed on the ridge structures. The growth technique was further optimized for formation of sub-micron pitch honeycomb structures, which corresponds to integration of BDD node devices up to 108 devices/cm2
Keywords
III-V semiconductors; atomic force microscopy; binary decision diagrams; cathodoluminescence; gallium arsenide; indium compounds; large scale integration; molecular beam epitaxial growth; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor quantum wires; AFM; H; InGaAs; InGaAs ridge quantum wire honeycomb network; SEM; atomic hydrogen assisted selective MBE growth; binary decision diagram; cathodoluminescence; hexagonal circuit; photoluminescence; quantum LSI; Atomic force microscopy; Atomic measurements; Binary decision diagrams; CMOS technology; Circuits; Hydrogen; Indium gallium arsenide; Molecular beam epitaxial growth; Scanning electron microscopy; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
Conference_Location
Nara
ISSN
1092-8669
Print_ISBN
0-7803-6700-6
Type
conf
DOI
10.1109/ICIPRM.2001.929196
Filename
929196
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