DocumentCode :
3182949
Title :
Atomic hydrogen assisted selective MBE growth of InGaAs ridge quantum wire honeycomb network structures for binary-decision diagram quantum LSIs
Author :
Ito, Akira ; Muranaka, Tsutomu ; Kasai, Seiya ; Hasegawa, Hideki
Author_Institution :
Graduate Sch. of Electron. & Inf. Eng., Hokkaido Univ., Sapporo, Japan
fYear :
2001
fDate :
2001
Firstpage :
521
Lastpage :
524
Abstract :
Novel hexagonal quantum circuits based on the binary-decision diagram (BDD) architecture have been recently proposed by our group towards next generation quantum LSIs (Q-LSIs) operating at room temperature. In this paper, feasibility of InGaAs ridge quantum wire (QWR) honeycomb network structures for such quantum circuits is investigated using atomic hydrogen (H*)-assisted selective MBE. The fabricated structures were characterized in detail by SEM, AFM, PL and CL measurements. By using patterned substrates with wire directions of <100>-<1¯10> and <510>-<1¯10> together with optimized H*-assisted selective MBE, honeycomb networks of the sharp and uniform InGaAs ridge structures were realized. Embedded InGaAs QWR honeycomb networks were successfully formed on the ridge structures. The growth technique was further optimized for formation of sub-micron pitch honeycomb structures, which corresponds to integration of BDD node devices up to 108 devices/cm2
Keywords :
III-V semiconductors; atomic force microscopy; binary decision diagrams; cathodoluminescence; gallium arsenide; indium compounds; large scale integration; molecular beam epitaxial growth; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor quantum wires; AFM; H; InGaAs; InGaAs ridge quantum wire honeycomb network; SEM; atomic hydrogen assisted selective MBE growth; binary decision diagram; cathodoluminescence; hexagonal circuit; photoluminescence; quantum LSI; Atomic force microscopy; Atomic measurements; Binary decision diagrams; CMOS technology; Circuits; Hydrogen; Indium gallium arsenide; Molecular beam epitaxial growth; Scanning electron microscopy; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
Conference_Location :
Nara
ISSN :
1092-8669
Print_ISBN :
0-7803-6700-6
Type :
conf
DOI :
10.1109/ICIPRM.2001.929196
Filename :
929196
Link To Document :
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