Title :
Rapid thermal processing of conventionally and electromagnetically cast 100 cm2 multicrystalline silicon
Author :
Sivoththaman, S. ; Laureys, W. ; De Schepper, P. ; Nijs, J. ; Mertens, R.
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
100 cm2 n+pp+ solar cells have been fabricated by rapid thermal processing (RTP) on conventionally cast (CC) and electromagnetically cast (EMC) multicrystalline silicon (mc-Si). All thermal steps were carried out by fast-ramp (>30°C/s) RTP using tungsten-halogen lamps. Emitter and BSF were simultaneously formed by RTP co-diffusion of phosphorous and boron/or aluminum (50-60 seconds) and surface passivation by rapid thermal oxidation, RTO (40-50 seconds). The all-RTP process resulted in 14.1% and 13.3% efficient cells on CC and EMC mc-Si respectively. The EMC cells, when subjected to an additional plasma hydrogen treatment, improved to give the same efficiency as the CC mc-Si cells. Systematic lifetime measurements performed on these materials show that the degradation in the EMC mc-Si is mainly due to the activated crystallographic defects, responding favourably to hydrogenation treatments but poorly to RT-gettering treatments. On the other hand, significant gettering effects are observed in CC mc-Si
Keywords :
casting; crystal defects; elemental semiconductors; getters; oxidation; passivation; rapid thermal processing; semiconductor materials; silicon; solar cells; 13.3 percent; 14.1 percent; 40 to 60 s; RT-gettering treatments; Si; Si solar cells; Si:Al; Si:B; Si:P; activated crystallographic defects; aluminum co-diffusion; boron co-diffusion; conventionally cast multicrystalline silicon; electromagnetically cast multicrystalline silicon; gettering effects; lifetime measurements; n+pp+ solar cells fabrication; phosphorus co-diffusion; plasma hydrogen treatment; rapid thermal oxidation; rapid thermal processing; surface passivation; tungsten-halogen lamps; Aluminum; Boron; Electromagnetic compatibility; Lamps; Oxidation; Passivation; Photovoltaic cells; Rapid thermal processing; Silicon; Surface treatment;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564205