DocumentCode
3183058
Title
Requirements and tools for testing of System Integrity Protection Schemes
Author
Apostolov, A. ; Vandiver, B.
Author_Institution
OMICRON Electron., Houston, TX, USA
fYear
2010
fDate
March 29 2010-April 1 2010
Firstpage
1
Lastpage
5
Abstract
The paper discusses in detail the requirements for functional testing of devices and distributed functions used in SIPS. The methods for testing of such systems are proposed based on the testing of individual IEDs used in the system, distributed functions within a substation and between substations, complete SIPS and End-to-end testing of SIPS. Methods for the testing of complex SIPS, such as white and black box testing, top-down and bottom up testing are discussed. Solutions for the testing of the individual devices, as well as for the testing of distributed applications are described in detail.
Keywords
substation protection; testing; SIPS; end-to-end testing; substation; system integrity protection schemes; System Integrity Protection Schemes (SIPS); testing;
fLanguage
English
Publisher
iet
Conference_Titel
Developments in Power System Protection (DPSP 2010). Managing the Change, 10th IET International Conference on
Conference_Location
Manchester
Type
conf
DOI
10.1049/cp.2010.0275
Filename
5522111
Link To Document