DocumentCode :
3183068
Title :
Automated production of information models for use in model-based diagnosis
Author :
Sheppard, John W. ; Simpson, William R.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fYear :
1992
fDate :
18-22 May 1992
Firstpage :
972
Abstract :
The approach to system maintenance uses a model of the system as a foundation for its knowledge base. A particular type of model, the information flow model, is very useful for diagnosing problems. The authors explore a learning approach to assist the modeling process. They describe a system in which a simulation model was used as a teacher to identify test attributes automatically for the system to be diagnosed. The automated modeling system begins with a simulation model and evaluates tests in a nominal situation to determine the limits and tolerances on these tests. The system then sequentially fails the components in the system and reruns the simulation to determine which tests will fail. The results of these simulations define an attribute map for the system that becomes the basis for an information flow model to be processed by the system testability and maintenance program (STAMP) and the portable interactive troubleshooter, (POINTER). These tools function together and use an information flow model to assess system testability and diagnose faults
Keywords :
automatic test equipment; automatic testing; digital simulation; fault location; knowledge based systems; learning systems; maintenance engineering; POINTER; STAMP; attribute map; automated modeling; information flow model; information models; knowledge base; learning; model-based diagnosis; portable interactive troubleshooter; simulation model; system maintenance; teacher; test attributes; testability; Diagnostic expert systems; Encoding; Failure analysis; Fault diagnosis; Mathematical model; Medical diagnostic imaging; Medical expert systems; Production; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0652-X
Type :
conf
DOI :
10.1109/NAECON.1992.220476
Filename :
220476
Link To Document :
بازگشت