DocumentCode
3183068
Title
Automated production of information models for use in model-based diagnosis
Author
Sheppard, John W. ; Simpson, William R.
Author_Institution
ARINC Res. Corp., Annapolis, MD, USA
fYear
1992
fDate
18-22 May 1992
Firstpage
972
Abstract
The approach to system maintenance uses a model of the system as a foundation for its knowledge base. A particular type of model, the information flow model, is very useful for diagnosing problems. The authors explore a learning approach to assist the modeling process. They describe a system in which a simulation model was used as a teacher to identify test attributes automatically for the system to be diagnosed. The automated modeling system begins with a simulation model and evaluates tests in a nominal situation to determine the limits and tolerances on these tests. The system then sequentially fails the components in the system and reruns the simulation to determine which tests will fail. The results of these simulations define an attribute map for the system that becomes the basis for an information flow model to be processed by the system testability and maintenance program (STAMP) and the portable interactive troubleshooter, (POINTER). These tools function together and use an information flow model to assess system testability and diagnose faults
Keywords
automatic test equipment; automatic testing; digital simulation; fault location; knowledge based systems; learning systems; maintenance engineering; POINTER; STAMP; attribute map; automated modeling; information flow model; information models; knowledge base; learning; model-based diagnosis; portable interactive troubleshooter; simulation model; system maintenance; teacher; test attributes; testability; Diagnostic expert systems; Encoding; Failure analysis; Fault diagnosis; Mathematical model; Medical diagnostic imaging; Medical expert systems; Production; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
Conference_Location
Dayton, OH
Print_ISBN
0-7803-0652-X
Type
conf
DOI
10.1109/NAECON.1992.220476
Filename
220476
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