Title :
Status of InP-based metal organic MBE with reference to conventional MBE and MOVPE
Author :
Künzel, H. ; Gibis, R. ; Kaiser, R. ; Malchow, S. ; Schelhase, S.
Author_Institution :
Heinrich-Hertz-Inst. fur Nachrichtentech. Berlin GmbH, Germany
Abstract :
The applicability of selective area MOMBE for the monolithic integration of optoelectronic devices has been demonstrated. Selective deposition, either selective area or selective infill growth, was successfully applied to accomplish butt-coupling of active laser-type and passive or electro-optic waveguide-type devices in different laboratories. Regarding butt-joints MOMBE basically offers distinct advantages because its growth habit is virtually independent of geometrical mask pattern effects due to the absence of gas-phase related diffusion effects resulting in a simplified deposition process. Development of an optimized MOMBE growth process resulted in vertical sidewalls in combination with uniform material properties up to lateral growth interfaces thus avoiding MOVPE related deficiencies like enhanced growth rates near masked areas limiting compactness of PIC design. Nevertheless, this gain available by MOMBE is contrasted by the enhanced complexity of MOMBE arising from the combination of technical, i.e. need of UHV conditions, and chemical, use of metalorganic sources, challenges
Keywords :
III-V semiconductors; chemical beam epitaxial growth; indium compounds; semiconductor epitaxial layers; semiconductor growth; InP; InP optoelectronic device; active laser device; butt coupling; electro-optic waveguide device; monolithic integration; passive waveguide device; photonic integrated circuit; selective MOMBE deposition; selective area growth; selective infill growth; Design optimization; Electrooptic devices; Epitaxial growth; Gas lasers; Laboratories; Lasers and electrooptics; Material properties; Monolithic integrated circuits; Optoelectronic devices; Waveguide lasers;
Conference_Titel :
Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
Conference_Location :
Nara
Print_ISBN :
0-7803-6700-6
DOI :
10.1109/ICIPRM.2001.929208