Title :
Pattern Dependent Overwrite On Thick Media
Author :
Dee, R.H. ; Franzel, K. ; Jurneke, J.
Author_Institution :
Storage Technology Corp., Louisville, Co., 80028-8110 USA
Keywords :
Bandwidth; Current measurement; Disk recording; Filters; Frequency; Hard disks; Magnetic heads; Measurement standards; Pulse compression methods; Writing;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642702