Title :
Efficient static buffering to guarantee throughput-optimal FPGA implementation of synchronous dataflow graphs
Author :
Kee, Hojin ; Bhattacharyya, Shuvra S. ; Kornerup, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
Abstract :
When designing DSP applications for implementation on field programmable gate arrays (FPGAs), it is often important to minimize consumption of limited FPGA resources while satisfying real-time performance constraints. In this paper, we develop efficient techniques to determine dataflow graph buffer sizes that guarantee throughput-optimal execution when mapping synchronous dataflow (SDF) representations of DSP applications onto FPGAs. Our techniques are based on a novel two-actor SDF graph Model (TASM), which efficiently captures the behavior and costs associated with SDF graph edges (flow-graph connections). With our proposed techniques, designers can automatically generate upper bounds on SDF graph buffer distributions that realize maximum achievable throughput performance for the corresponding applications. Furthermore, our proposed technique is characterized by low polynomial time complexity, which is useful for rapid prototyping in DSP system design.
Keywords :
circuit complexity; data flow graphs; digital signal processing chips; field programmable gate arrays; integrated circuit design; DSP system design; SDF graph edges; efficient static buffering; field programmable gate arrays; graph buffer distributions; low polynomial time complexity; synchronous dataflow graph mapping; throughput-optimal FPGA implementation; throughput-optimal execution; two-actor SDF graph model; upper bounds; Complexity theory; Computational modeling; Digital signal processing; Field programmable gate arrays; Random access memory; Schedules; Throughput; FPGA; Synchronous dataflow; buffer memory; signal processing systems; throughput;
Conference_Titel :
Embedded Computer Systems (SAMOS), 2010 International Conference on
Conference_Location :
Samos
Print_ISBN :
978-1-4244-7936-8
Electronic_ISBN :
978-1-4244-7938-2
DOI :
10.1109/ICSAMOS.2010.5642074