• DocumentCode
    3183771
  • Title

    Using a real time digital simulator to affect the quality of IEC 61850 GOOSE and sampled value data

  • Author

    Ouellette, D.S. ; Desjardine, M.D. ; Forsyth, P.A.

  • fYear
    2010
  • fDate
    March 29 2010-April 1 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Testing IEC 61850 devices is a critical part of any substation automation scheme. Many IEDs have been installed and configured to provide status and control via GOOSE messages. IEDs can also be configured to listen to sampled value data. An important part of IEC 61850 data being transmitted can be the test and quality information. Real time digital simulation using a closed loop environment was done with IEDs to test their behaviour during abnormal system conditions. An RTDS Simulator was used to dynamically change the quality of data being transmitted to IEDs that can accept GOOSE and/or sampled values (SV) messages. The purpose of this work was to show how some IEC 61850 compliant IEDs react to abnormal IEC 61850 data and how to create these conditions.
  • Keywords
    IEC standards; digital simulation; substation automation; GOOSE messages; IEC 61850; IED; intelligent electronic device; quality information; real time digital simulator; sampled value data; substation automation; GOOSE; IEC 61850; Quality; Sampled Values; Test Mode;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Developments in Power System Protection (DPSP 2010). Managing the Change, 10th IET International Conference on
  • Conference_Location
    Manchester
  • Type

    conf

  • DOI
    10.1049/cp.2010.0236
  • Filename
    5522150