DocumentCode :
3183771
Title :
Using a real time digital simulator to affect the quality of IEC 61850 GOOSE and sampled value data
Author :
Ouellette, D.S. ; Desjardine, M.D. ; Forsyth, P.A.
fYear :
2010
fDate :
March 29 2010-April 1 2010
Firstpage :
1
Lastpage :
5
Abstract :
Testing IEC 61850 devices is a critical part of any substation automation scheme. Many IEDs have been installed and configured to provide status and control via GOOSE messages. IEDs can also be configured to listen to sampled value data. An important part of IEC 61850 data being transmitted can be the test and quality information. Real time digital simulation using a closed loop environment was done with IEDs to test their behaviour during abnormal system conditions. An RTDS Simulator was used to dynamically change the quality of data being transmitted to IEDs that can accept GOOSE and/or sampled values (SV) messages. The purpose of this work was to show how some IEC 61850 compliant IEDs react to abnormal IEC 61850 data and how to create these conditions.
Keywords :
IEC standards; digital simulation; substation automation; GOOSE messages; IEC 61850; IED; intelligent electronic device; quality information; real time digital simulator; sampled value data; substation automation; GOOSE; IEC 61850; Quality; Sampled Values; Test Mode;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Developments in Power System Protection (DPSP 2010). Managing the Change, 10th IET International Conference on
Conference_Location :
Manchester
Type :
conf
DOI :
10.1049/cp.2010.0236
Filename :
5522150
Link To Document :
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