Title :
Logic diagnosis-diversion or necessity?
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
Abstract :
Failure diagnosis is resource intensive, frustrating, and often impossible. However, it is also critical and necessary for aggressive designs and manufacturing processes. Research in this area is making rapid progress, but the challenges are also rapidly growing in magnitude and importance
Keywords :
automatic testing; circuit CAD; design for testability; fault diagnosis; logic CAD; logic testing; production testing; ATPG; CAD; DFT; IC diagnosis; failure diagnosis; logic diagnosis; memory diagnosis; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Logic; Manufacturing processes; Sequential analysis;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639646
