Title :
The fail-stop controller AE11
Author :
Böhl, E. ; Lindenkreuz, Th. ; Stephan, R.
Author_Institution :
Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
Abstract :
Using on-chip fault detection measures the fail-stop controller. AE11 was developed for safety critical applications aiming at high volume production of automotive and railway electronics. The trade-off between high defect coverage, short reaction time to faults and low chip area overhead results in a combination of concurrent checking, built-in self-test and built-in current-monitoring (IDDQ-test)
Keywords :
automotive electronics; built-in self test; controllers; fault location; railways; safety systems; AE11; IDDQ-test; automotive electronics; built-in current-monitoring; built-in self-test; chip area overhead; concurrent checking; defect coverage; fail-stop controller; high volume production; on-chip fault detection; railway electronics; reaction time; safety critical applications; Automatic testing; Automotive engineering; Built-in self-test; Circuit faults; Fault detection; Hardware; Monitoring; Power capacitors; Railway safety; Temperature control;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639665
