Title :
Experimental results for current-based analog scan
Author :
Soma, Mani ; Bocek, Thomas M. ; Vu, Tuyen D. ; Moffatt, Jason D.
Author_Institution :
Washington Univ., Seattle, WA, USA
Abstract :
This paper presents the design of current-mode circuits for analog scan, which include the highly accurate current-mirror scan latches and the analog shift registers. Experimental data from a test chip fabricated in Orbit 2-micron CMOS Foresight process illustrates that the accuracy of the circuits is sufficient for use in analog on-chip scan-based testing. The interface between analog scan and the P1149.4 test bus is discussed to show system-level applications of this technique
Keywords :
CMOS analogue integrated circuits; analogue processing circuits; automatic testing; current-mode logic; design for testability; integrated circuit testing; 2 micron; DFT; Orbit CMOS Foresight process; P1149.4 test bus; analog shift registers; current-based analog scan; current-mirror scan latches; current-mode circuits; on-chip scan-based testing; system-level applications; Built-in self-test; CMOS process; Capacitors; Circuit testing; Circuit topology; Design for testability; Latches; Mirrors; System testing; Voltage;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639690
